home-icon/Products / Infrared detectors / HgCdTe (MCT) Photovoltaic / HgCdTe photovoltaic IR detector PVI-5-1x1-TO39-NW-36

HgCdTe room temperature optically immersed photovoltaic infrared detectorPVI-5-1x1-TO39-NW-36

PVI-5-1x1-TO39-NW-36 is an uncooled photovoltaic IR detector based on HgCdTe heterostructure for optimal performance and stability, optically immersed to enhance the parameters. Its specific wavelength (λspec) is 5.0 µm and its optical area (Ao) is 1 mm × 1 mm. The cut‑on wavelength (λcut-on) can be optimized upon request. Applying a reverse bias (Vb) may significantly increase response speed and dynamic range. While this improves performance at high frequencies, be aware that the 1/f noise appearing in biased detectors may reduce performance at low frequencies. The detector is available in the TO39 package without a window.

Features

Spectral range: 2.3 to 4.4 µm

Back-side illuminated

Room temperature operation

Unique immersion lens technology applied

No bias required

No 1/f noise

No minimum order quantity required

Applications

Contactless temperature measurement: railway transport, industrial and laboratory processes monitoring

Flame and explosion detection

Threat warning systems

Heat-seeking, thermal signature detection

Dentistry

Gas detection, monitoring and analysis: CH4, C2H2, CH2O, HCl, NH3, SO2, C2H6, CO, CO2, NOx

Breath analysis: C2H6, CH2O, NH3, NO, OCS

Gas leak detection

Combustion process control

Non-destructive material testing

Detector configuration

Detector symbol
PVI-5-1x1-TO39-NW-36
Detector type
photovoltaic
Active element material epitaxial HgCdTe heterostructure
Cooling no
Temperature sensor n/a
Optical area, Ao 1 mm × 1 mm
Optical immersion hyperhemisphere
Package TO39 (3 pin)
Acceptance angle, Φ ~36 deg.
Window no

Specification

(Tamb = Tchip = 293 K, Vb = 0 V)

Parameter Value

Unit
Min. Typ. Max. -
Cut-on wavelength, λcut-on (10%) - 2.0 - μm
Peak wavelength, λpeak - 4.4±0.2 - μm
Specific wavelength, λspec - 5.0 - μm
Cut-off wavelength, λcut-off (10%) - 5.4 - μm
Detectivity, D* (λpeak, 20 kHz) - 2.5×1010 - cm⋅Hz1/2/W
Detectivity, D* (λspec, 20 kHz) 1.0×1010 1.5×1010 - cm⋅Hz1/2/W
Current responsivity, Ripeak) - 2.0 - A/W
Current responsivity, Rispec) 1.0 1.2 - A/W
Time constant, τ - 120 - ns
Dynamic resistance, Rd 100 250 - Ω

Spectral response

(Typ., Tamb = Tchip = 293 K)

Graph showing detectivity (D*) versus wavelength (λ) from 2.0 to 6.0 micrometers. Detectivity values range from 1E+09 to 1E+11 cm·Hz^1/2/W. The curve peaks around 2.8 to 5.0 micrometers.
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Temperature sensor characteristics

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