home-icon/Products / Infrared detectors / HgCdTe (MCT) Photovoltaic / HgCdTe photovoltaic IR detector PVI-2TE-6-1x1-TO8-wZnSeAR-36

HgCdTe two-stage thermoelectrically cooled optically immersed photovoltaic infrared detectorPVI-2TE-6-1x1-TO8-wZnSeAR-36

PVI-2TE-6-1x1-TO8-wZnSeAR-36 is a two-stage thermoelectrically cooled (2TE) photovoltaic IR detector based on HgCdTe heterostructure for optimal performance and stability, optically immersed to enhance the parameters. Their specific wavelength (λspec) is 6.0 µm and its optical area (Ao) is 1 mm × 1 mm. The cut‑on wavelength (λcut-on) can be optimized upon request. Applying a reverse bias (Vb) may significantly increase response speed and dynamic range. While this improves performance at high frequencies, be aware that the 1/f noise appearing in biased detectors may reduce performance at low frequencies. The detector is available in TO8 package with a 3 deg. wedged zinc selenide anti-reflection coated window (wZnSeAR) to prevent unwanted interference effects.

Features

Spectral range: 2.6 to 7.0 µm

Back-side illuminated

Two-stage thermoelectrically cooled

Unique immersion lens technology applied

No bias required

No 1/f noise

No minimum order quantity required

Applications

Gas detection, monitoring and analysis: CH4, C2H2, CH2O, HCl, NH3, SO2, C2H6, CO, CO2, NOx, SOx, HNO3

Exhaust gas denitrification

Combustion process control

Contactless temperature measurement: railway transport, industrial and laboratory processes monitoring

Heat-seeking, thermal signature detection

Non-destructive material testing

Biochemical analysis

Laser calibration

Detector configuration

Detector symbol
PVI-2TE-6-1x1-TO8-wZnSeAR-36
PVI-2TE-6-1x1-TO66-wZnSeAR-36
Detector type
photovoltaic
Active element material epitaxial HgCdTe heterostructure
Cooling 2TE (Tchip ≅ 230 K)
Temperature sensor thermistor
Optical area, Ao 1 mm × 1 mm
Optical immersion hyperhemisphere
Package 2TE-TO8 2TE-TO66
Acceptance angle, Φ ~36 deg.
Window wZnSeAR (3 deg. wedged zinc selenide, anti-reflection coating)

Specification

(Tamb = 293 K, Tchip = 230 K, Vb = 0 V)

Parameter Value

Unit
Min. Typ. Max. -
Cut-on wavelength, λcut-on (10%) - 2.6 - μm
Peak wavelength, λpeak - 5.4±0.2 - μm
Specific wavelength, λspec - 6.0 - μm
Cut-off wavelength, λcut-off (10%) - 7.0 - μm
Detectivity, D* (λpeak, 20 kHz) - 8.0×1010 - cm⋅Hz1/2/W
Detectivity, D* (λspec, 20 kHz) 4.0×1010 6.0×1010 - cm⋅Hz1/2/W
Current responsivity, Ripeak) - 2.5 - A/W
Current responsivity, Rispec) 1.3 1.8 - A/W
Time constant, τ - 50 - ns
Dynamic resistance, Rd 0.3 1 -

Spectral response

(Typ., Tamb = 293 K, Tchip = 230 K)

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Temperature sensor characteristics

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