home-icon/Products / Infrared detectors / InAs and InAsSb IR Detectors / InAsSb photovoltaic IR detector PVIA-5-0.3x0.3-TO46-pAl2O3-40

InAsSb room-temperature optically immersed photovoltaic infrared detectorPVIA-5-0.3x0.3-TO46-pAl2O3-40

PVIA-5-0.3x0.3-TO39-pAl2O3-40 is an uncooled photovoltaic IR detector based on an InAsSb heterostructure for optimal performance and stability, optically immersed to enhance the parameters. It enables the detection of radiation in the range from 1.7 μm to 5.4 μm. Its optical area (Ao) is 0.3 mm × 0.3 mm. The detector is available in the TO46 package with a planar sapphire window (pAl2O3).
Innovative lens fabrication technology enables faster production of high-performance detectors.

Features

Spectral range: 1.7 to 5.4 µm

RoHS-compliant III-V material

High ambient operating and storage temperature

Innovative chemically processed microlens technology applied

Back-side illuminated

No minimum order quantity required

Applications

Gas detection, monitoring and analysis: CH4, C2H2, CH2O, HCl, NH3, SO2, C2H6, CO, CO2, NOx

Breath analysis: C2H6, CH2O, NH3, NO, OCS

Contactless temperature measurement: railway transport, industrial and laboratory processes monitoring

Flame and explosion detection

Threat warning systems

Heat-seeking, thermal signature detection

Dentistry

Gas leak detection

Combustion process control

Non-destructive material testing

Detector configuration

Detector symbol PVIA-5-0.3x0.3-TO46-pAl2O3-40
Detector type photovoltaic
Active element material epitaxial InAsSb heterostructure
Cooling no
Temperature sensor n/a
Optical area, Ao 0.3 mm × 0.3 mm
Optical immersion hemisphere (chemical processing)
Package TO46 (3 pin)
Acceptance angle, Φ ~40 deg.
Window pAl2O3 (planar sapphire)

Specification

(Tamb = Tchip = 293 K, Vb = 0 V)

Parameter Value Unit
Min. Typ. Max
Cut-on wavelength, λcut-on (10%) - 1.7 - μm
Peak wavelength, λpeak - 4.0 - μm
Cut-off wavelength, λcut-off (10%) - 5.4 - μm
Detectivity, D* (λpeak, f = 20 kHz) - 4.0×109 - cm·Hz1/2/W
Current responsivity, Ripeak) - 1.0 - A/W
Time constant, τ - 20 -  ns
Dynamic resistance, Rd - 300 - Ω

Spectral response

(Typ., Tamb = Tchip = 293 K)

Line graph showing detectivity (D*) vs. wavelength (1.5–6.0 µm) for three chip temperatures (253K, 293K, 323K); detectivity decreases as wavelength and temperature increase. Three curves are shown for each temperature.
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Temperature sensor characteristics

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