HgCdTe (MCT) Photoconductive Detector

PCI-2TE-5

1.0 – 5.4 µm, two-stage thermoelectrically cooled, optically immersed

PCI-2TE-5 is two-stage thermoelectrically cooled IR photoconductive detector based on sophisticated HgCdTe heterostructure for the best performance and stability, optically immersed in order to improve parameters of the device. The detector is optimized for the maximum performance at λopt = 5.0 μm. Cut-on wavelength is limited by GaAs transmittance (~0.9 µm). The device should operate in optimum bias voltage and current readout mode. Performance at low frequencies is reduced due to 1/f noise. 3° wedged sapphire (wAl2O3) window prevents unwanted interference effects.

See specification

Features

High performance in the 1.0 – 5.4 µm spectral range

Two-stage thermoelectrically cooled

Hyperhemiimmersion microlens technology applied

Long lifetime and MTBF

Stability and reliability

1/f noise

Specification (Ta = 20°C)

Parameter
PCI-2TE-5
Active element material
epitaxial HgCdTe heterostructure
Optimum wavelength λopt, µm
5.0
Detectivity D*(λpeak, 20 kHz), cm⋅Hz1/2/W
≥4.0×1010
Detectivity D*(λopt, 20 kHz), cm⋅Hz1/2/W
≥2.0×1010
Current responsivity-optical area length product Riopt)·LO, A·mm/W
≥3.0
Time constant τ, ns
≤20000
1/f noise corner frequency fc, Hz
≤10k
Bias voltage-optical area length ratio Vb/LO, V/mm
≤0.2
Resistance R, Ω
≤1200
Active element tempearture Tdet, K
~230
Optical area AO, mm×mm
0.5×0.5, 1×1, 2×2
Package
TO8, TO66
Acceptance angle, Φ
~36°
Window
wAl2O3

Spectral response (Ta = 20°C)

PCI-2TE-5-1

Mechanical layout, mm

2TE-TO8-imm-3

2TE-TO8 package

2TE-TO66-imm-1

2TE-TO66 package

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